Top Page > About JAMSTEC > Research Vessels, Facilities and Equipment > Facilities and Equipment in Yokosuka Headquarters > Transmission Electron Microscope
Outline
This device is used for observation of the images that an accelerated electron beam irradiates on a specimen and magnifies the distribution of transmitted electrons to specimens and makes image formation on a fluorescence screen by an electron lens and records them in the form of photographs.
<Specifications>
| Item | Explanation |
|---|---|
| Resolution | |
| Lattice image | 0.2nm |
| Particle image | 0.36nm |
| Accelerating voltage | 40, 60, 80, 100, 120kV |
| Magnification | |
| MAG mode | × 1,000～800,000 |
| Low MAG mode | × 20～3,000 |
| SA MAG mode | × 20,000～100,000 |
| IOS (MAG) mode | × 4,000～100,000 (±90°) |
| IOS (LOW MAG) mode | × 50～3,000 (±30°) |
| Objective lens | |
| Focal length | 3.4mm |
| Spherical aberration | 2.4mm |
| Chromatic aberration | 2.5mm |
